1993

Grigorieff N, Cherns D, Yates MJ, Hockly M, Perrin SD, Aylett MR | 1993 | Electron microscopy of ultra-thin buried layers in InP and InGaAs | Grigorieff_PhilMag1993.pdf - 5.82 MB
Duan XF, Grigorieff N, Cherns D, Steeds JW, Sheng C | 1993 | Profiling of Ge(X)Si(1-X)/Si strained-layer superlattices by large-angle convergent-beam electron diffraction and electron holography | Duan_IPCS1993.pdf - 1.72 MB

1991

Jordan IK, Grigorieff N, Cherns D, Hockly M, Spurdens PC, Aylett MR, Scott EG | 1991 | The detection of strain within InP-InGaAs single quantum well structures using large-angle convergent-beam electron diffraction | Jordan_IPCS1991.pdf - 2.27 MB