Hockly M

Displaying 1 - 2 of 2

2009

Grigorieff N, Cherns D, Yates MJ, Hockly M, Perrin SD, Aylett MR. Electron microscopy of ultra-thin buried layers in InP and InGaAs. 2009. Download: Grigorieff_PhilMag1993.pdf - 5.82 MB

Jordan IK, Grigorieff N, Cherns D, Hockly M, Spurdens PC, Aylett MR, Scott EG. The detection of strain within InP-InGaAs single quantum well structures using large-angle convergent-beam electron diffraction. 2009. Download: Jordan_IPCS1991.pdf - 2.27 MB

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