Duan XF

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2009

Duan XF, Grigorieff N, Cherns D, Steeds JW, Sheng C. Profiling of Ge(X)Si(1-X)/Si strained-layer superlattices by large-angle convergent-beam electron diffraction and electron holography. 2009. Download: Duan_IPCS1993.pdf - 1.72 MB

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