vary defocus when taking a lot of images

Submitted by xuchen on Tue, 2013-02-12 12:56

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Electron Microscopy and Image Processing

In single particle application, we take a lot of images. And for CTF flattening purpose, we want to change the defocus a little bit. With SerialEM, this can be done super easy - we simply change target defocus before doing autofocus. Here is an example showing how powerful and flexible the macro can provide.

http://www.bio.brandeis.edu/KeckWeb/emdoc/en_US.ISO8859-1/articles/Seri…