Ewald sphere correction for single-particle electron microscopy
Publication Type
Journal Article
Year of Publication
2006
Refereed Designation
Refereed
Journal
Ultramicroscopy
Volume
106
Pagination
376-82
Date Published
Mar
ISSN
0304-3991 (Print)
Accession Number
16384646
Citation Key
59
Number
4-5
Keywords
Algorithms, Data Display, Fourier Analysis, Imaging, Three-Dimensional/*methods, Microscopy, Electron/*methods, Viruses/chemistry/ultrastructure
Abstract
Most algorithms for three-dimensional (3D) reconstruction from electron micrographs assume that images correspond to projections of the 3D structure. This approximation limits the attainable resolution of the reconstruction when the dimensions of the structure exceed the depth of field of the microscope. We have developed two methods to calculate a reconstruction that corrects for the depth of field. Either method applied to synthetic data representing a large virus yields a higher resolution reconstruction than a method lacking this correction.
