A dose-rate effect in single-particle electron microscopy
Publication Type
Journal Article
Year of Publication
2008
Refereed Designation
Refereed
Journal
J Struct Biol
Volume
161
Pagination
92-100
Date Published
Jan
ISSN
1047-8477 (Print)
Accession Number
17977018
Citation Key
53
Number
1
Keywords
Cryoelectron Microscopy/*methods, "Image Processing, Computer-Assisted/*methods", Tobacco Mosaic Virus/ultrastructure
Abstract
A low beam intensity, low electron dose imaging method has been developed for single-particle electron cryo-microscopy (cryo-EM). Experiments indicate that the new technique can reduce beam-induced specimen movement and secondary radiolytic effects, such as "bubbling". The improvement in image quality, especially for multiple-exposure data collection, will help single-particle cryo-EM to reach higher resolution.
